Previous issue: #9 (comment)
Laue_Sims+cif_ZrCl4_100 beam center.zip
Regarding the automated peak prediction tool for Laue diffraction created here, I would like to suggest improving it by adding in the ability to predict peaks that will show up depending on the tube voltage used to generate X-rays incident to the crystal, as well as peak positions depending on the distance between the sample and the film. Attached here is a .zip file containing sample data for use in constructing these improvements; a .cif file for ZrCl4 from ICSD and simulated diffraction patterns as well as simulated patterns along the (100) plane using different sample-to-film distances and variable tube voltages.
All of the simulated patterns were generated using a tungsten x-ray source.
Previous issue: #9 (comment)
Laue_Sims+cif_ZrCl4_100 beam center.zip
Regarding the automated peak prediction tool for Laue diffraction created here, I would like to suggest improving it by adding in the ability to predict peaks that will show up depending on the tube voltage used to generate X-rays incident to the crystal, as well as peak positions depending on the distance between the sample and the film. Attached here is a .zip file containing sample data for use in constructing these improvements; a .cif file for ZrCl4 from ICSD and simulated diffraction patterns as well as simulated patterns along the (100) plane using different sample-to-film distances and variable tube voltages.
All of the simulated patterns were generated using a tungsten x-ray source.