tests/periph_gpio: reduce benchmark iterations#14640
tests/periph_gpio: reduce benchmark iterations#14640gschorcht merged 1 commit intoRIOT-OS:masterfrom
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benpicco
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If Murdock is happy, this sould be fine.
(But can Murdock even be truly happy with the current nrf52dk situation?)
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I'm wondering whether it will solve the benchmark problem on ATmega. When I was benchmarking the new GPIO API in PR #14607, I had either to reduce the number of tests to 1000 or to remove the |
that (results completely nonsense) probably was caused by #14639! |
ah, didn't read good, you had that figured out already... |
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Unfortunatly, 100k iterations are is still too much for ATmega. With It makes no sense that Just for information, real values are: which makes much more sense. |
Yeah, a year ago when I was already working on the new GPIO API. But this should be solved with PR #14639. |
That's why, I also used an own version in RIOT/tests/periph_gpio_exp/main.c Lines 33 to 48 in 70db5f7 |
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It seems that Murdock failed due to a reason that is not related to this PR. |
Our MCU's are predictable enough that 100k iterations should suffice.
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too much shouldn't happen, just take longer. I think this pr didn't include the irq disable fix PR. I've rebased, so it should now. Can you double check? |
Cool, now it is correct 👍 |
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Unrelated tests failed: will re-trigger. |
thanks for confirming! |
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Murdock is happy, failed tests before were not related to this PR. |
Contribution description
Our MCU's are predictable enough that 100k iterations should suffice.
No need to wait tens of seconds.
Testing procedure
Issues/PRs references
Found in #12457, was about to increase test time for z1.