DRAM fault-error simulation

Modified date: 08.01.2017

Copyright

Copyright 2023, The University of Texas at Austin All rights reserved.

THIS FILE IS PART OF THE DRAM FAULT ERROR SIMULATION FRAMEWORK

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Overview

Fault-Error Simulator is a DRAM reliability evaluation framework to estimate the reliability of various error correcting codes (ECC). .

How to build and run

1. Makefile contains single line command for build and will output an executable "faulterrorsim"

    $make 
   

2. This executable requires multiple parameters as below:

    $./faulterrorsim
    Usage for system evaluation  : ./faulterrorsim ECCID runCnt RandomSeed S PermanentRate PermanentAct IntermittentRate IntermittentAct
    Usage for scenario evaluation: ./faulterrorsim ECCID runCnt RandomSeed FaultType1 FaultType2 ... 
   

   • ECCID: Index representing the domain group with a specific DRAM configuration and a specific ECC scheme (this indices are declared in main.c)
   • runCnt: Number of random iterations to be executed for MonteCarlo simulations.
   • Randomseed: Any string input as the random seed for simulations (the same seeds will generate the same results - beneficial for debugging)
   • FaultType: FaultType indicates which fault type will be added. For example, FaultType 'b' implies bit error and FaultType 'p' implies pin error in a memory transfer block. If FaultType 'S' is inputted, this implies system evaluation (DUE/SDC probability for a specific system over time).
   • PermanentRate is the rate (or ratio) that a DRAM cell has permanent single bit fault (frequently weak)
   • PermanentAct is the probability that permanent single bit faults generating errors
   • IntermittentRate is the rate (or ratio) that a DRAM cell has intermittent single bit fault (rarely weak)
   • IntermittentAct is the probability that latent single bit faults generating VRT errors

3. For system evaluation, for example, run as below

    $./faulterrorsim 1230 1000000 test S i6 1e-1 1e-5 1e-7
   

   • ECCID 1230 denotes DUO (BCH TEC)
   • A million iterations
   • System evaluation 'S' requires four additional parameters
   • i6 for PermanentRate denotes 1e-6 (defined in Fault.cc)

4. For scenario evaluation, for example, run as below

    $./faulterrorsim 1230 1000000 test b b
   

   • ECCID 1230 denotes DUO (BCH TEC)
   • A million iterations
   • Multiple fault types can be injected together
   • 'b b' denotes double bit fault pattern