MoDLEx is a cross-platform graphical tool designed for researchers to analyze Electron Beam Induced Current (EBIC) data. It provides a workflow to extract the carrier diffusion length (L) from semiconductor materials using curve-fitting algorithms.
Watch the Quick Start Guide on YouTube
- Dual-Image Analysis: Load and compare EBIC and Secondary Electron (SE) images side-by-side to correlate electrical signals with topography.
- Real-Time Line Profiles: Dynamic extraction of line profiles with adjustable averaging widths.
- Physics Modeling: Support for power-law exponents (n=-0.5 or n=-1.5).
- Automated Fitting: One-click fitting with user-defined constraints and guesses.
- Comprehensive Export: Save high-resolution graphs, CSV raw data, or a full "Analysis Abstract" report in PNG or PDF format.
MoDLEx is distributed as a standalone binary for easy use without needing a Python environment.
Go to the Releases page to download the latest version for your OS:
- Windows: .exe
- macOS: .dmg
- Linux: .AppImage
If you prefer to run the script directly:
-
Clone the repository:
git clone https://github.com/ocakiroglu/MoDLEx.git -
Install dependencies:
pip install PySide6 numpy pillow matplotlib scipy -
Run the application:
python MoDLEx-v2_1.py
- Load Images: Import your EBIC and SE maps (TIFF, PNG, or JPG).
- Setup View: Adjust the Scan Line center and the Contact/Boundary edges using the interactive sliders.
- Configure Fit: Set your physical parameters (Long edge size, offsets, and power law exponent).
- Perform Fit: Click "PERFORM FIT" to visualize the results.
- Export: Export your findings as a standardized PDF abstract or CSV data.
MoDLEx fits your data to the fundamental EBIC decay model:
where
This project is licensed under the MIT License. See the LICENSE file for details.
This code in GUI design stage was developed with coding assistance from Google's Gemini, Github Copilot and Claude model via Perplexity.